F02100 - SEMI F21 - 清浄な環境における空気を媒体とする分子汚染レベルの分類 StdTpc-Package Test Methods and discuss the quality of
$115.50
Description
and discuss the quality of data produced by the production equipment
This test is used to evaluate the susceptibility and occurrence of discoloration of PV finger metallization
0008 and 2000 Ω·cm for p-type silicon and between 0
and other components as a measure of the effectiveness of passivation
F02100 - SEMI F21 - 清浄な環境における空気を媒体とする分子汚染レベルの分類 StdTpc-Package Test Methods and discuss the quality ofNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI Global Facilities CommitteeNorth American Facilities Committee2002829 North American Regional Standards Committee20029www. semi. org2002111995 1 Referenced SEMI Standards None.
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