C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Revision:SEMI C105-0923 - Current The model consists of equipment

The model consists of equipment characteristics and behaviors that are to be implemented in addition to the SEMI E30 fundamental requirements and selected additional capabilities

どのデータ・アイテムがオプションで，どれが必須の仕様かは本文書の中で指定されない。

and mechanical properties of FPD substrates

previously published December 2011

C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Revision:SEMI C105-0923 - Current The model consists of equipmentPurpose The purpose of this Guide is to recommend procedures for trace iron analysis in high purity 2 propanol (IPA) needed by the semiconductor industry. Scope The scope of this Guide is the measurement of iron concentration in IPA, used in the semiconductor industry, with higher purity than Grade 4 IPA described in SEMI C41. The quantitative range of this method is 1 to 100 ppt. Instruments (bottles, etc.) for sampling IPA to be analyzed are