Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

Recessed PELCO SEMClamp™ 25 x 15mmDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

The tweezer trap for 5 tweezers is our most popular model for a variety of lab applications

Combines a tip with 1 nm nominal end radius

Replacement Tips 5 PEEK 0

Other applications of this probe include: Scanning Capacitance Microscopy (SCM)

flat edges 7 115mm Superalloy 0

high-amplitude force imaging in air

They exhibit very fine grain and minimal interference with specimen structure

The square PELCO® Q Stubs have an easy to locate reference notch on one of the corners

Resistant to UV and nuclear radiation (sterilization)

Stronger membrane for multiple handling

Index l is 75 mesh for the strong bars and each square is bisected in both directions with thinner bars

A marker pen can be used to write on the magnetic material