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Description

CLFC-NOBO3 cantilevers: 0. 16, 1. 3, & 10. 4 N m DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Calibration Probes A variety pack of tipless calibration levers with three different spring constants. Unmounted for all AFMs. For a less expensive uncalibrated version of this probe, please see CLFC NOCAL. Quantity=5 No tip image available. Tipless cantilever. Tip Geometry: Tipless This product is used as reference cantilevers for calibrating

- Mounted for the Dimension AFM

5 Tip Radius (Nom): 8 Tip Set Back (Nom): 12

Cantilever Material: 1 Ωcm Silicon Cantilever Thickness (Nom): 2 Cantilever Thickness (RNG): 1

5 Tip Radius (Nom): 35 Tip Radius (Max): 50 Tip Set Back (Nom): 9

High wear resistant diamond cone probe with high probe-to-probe consistency in tip shape and a tip-radius of 20nm

nominal 180nm (1

Samples on 12mm discs DESCRIPTION

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM)

Solid Metal Probe

Bruker's new MESP-LM-V2 probe replaces the legacy MESP-LM probe

Al Reflex Coating

The MESP-V2 has a nominal coercivity of 400 Oe (medium)