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Description

Bulk Specimen HolderDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Size in mm I

easy to handle

Dimensions of 81 TEM grid version: 63

Stainless Steel Handle 259 130mm Carbofib 0

Si3N4 50nm membrane with 0

Spring repair kits for this probe holder are available as part number 990-031-500

4mm Aperture

Width x Thickness 510-4 DUMONT Biology 4ACN 108mm SS 0

High hardness with high elasticity

This advanced CD calibration test specimen is suited for calibrating smaller structures

pin stub extender allows bringing pin stubs and pin stub sample holders closer to the pole piece without moving the SEM sample stage

ESD safe Buna-N cups