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Description

ElectriTap300-GElectrical, Tapping Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Tapping Mode AFM Probe Monolithic silicon AFM probe for high frequency non contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample

Holds up to 2 FIB grids of the same thickness

Films are resistant to solvents

shown holding specimen mounts and bottom

A set of useful holders to quickly mount multiple standard Ø15mm Hitachi mounts with M4 thread on a base with M4 thread

21610-57 - 5 x 7mm stealth-diced Ultra-Flat Wafer

It will work with manual

I - 16047 SDS (114KB PDF)

5 10 6 40 - • G2000HS 12

when used in conjunction with the optional MTM-10 high resolution thickness monitor

16059-10 Technical Note (360KB PDF)

used tips must be thrown away or checked by SEM regularly

and Surface Potential Microscopy (SPoM) modes