Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

CDR50CRound Re Entrant Tips for 3 D imaging Max W = 50 nm, Max OH = 8 nm, Max EL = 350 nm Carbon Coated DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Round Re Entrant Tips for 3 D imaging Max Width = 50 nm Max Overhang = 8 nm Max Effective Length = 350 nm Carbon Coated Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 20 Tip Coating: Amorphous Carbon Tip Set Back( RNG): 5 15 The Aluminum reflective coating on the backside of the

In electrical applications

electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)

Tip Geometry: Rotated (Symmetric) Tip Height: 3 - 8 Front Angle: 15+/-2 Back Angle: 25+/-2 Side Angle: 17

with reflective coating

10 or later software and MultiMode 8

Note: Requires specialized probe holder (part of the VITA module)

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon

5pk Cantilever Thickness (Nom): 3 Cantilever Thickness (RNG): 2

5cc syringe

A pack of 10 High quality etched silicon probes for soft TappingMode™imaging and force modulation in air

Max Width = 300 nm

In July 2015 Bruker implemented a new process to achieve higherquality and consistency in this probe's physical appearance anddimensions