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Description

PELCO® Q Multi Pin Stub HoldersDESCRIPTION PELCO Scanning Electron Microscopy Pin Stubs A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy. The PELCO Q Pin Stubs have been especially designed for correlative microscopy, corroborative SEM investigations and repetitive SEM imaging analysis and specimen preparation. The square PELCO Q Stubs have an easy to locate reference notch on one of the corners. Using the SEM X and Y stage movements

33mm Plastic tweezers made from glass filled Delrin®

and high resonance frequency of 110 kHz in fluid to provide reliable highest resolution imaging at high imaging rates with up to 8 kHz PeakForce Tapping actuation

145nm Very High Resolution AFM Reference Standard on 12mm steel disk

Clean and sharp lines

flat accurate round tips 2A 120mm NM-SS Ø1

Converts any Hitachi M4 type specimen mount into a pin stub style mount (FEI/Philips

208C High Vacuum Turbo Carbon Coater

IMEC Calibration Structure - CS01 - SiAs

makes this product suitable for demanding specimen preparation in surface science and SEM applications

MRS-3 and MRS-4 are currently still available)

non-outgassing

01807 - Formvar/Carbon

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