Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) Ingestion-build-256245 PD IEC/TS 62720 is provided

PD IEC/TS 62720 is provided in the IEC Common Data Dictionary (CDD)

The series applies to unfired pressure vessels with a maximum allowable pressure greater than 0

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Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) Ingestion-build-256245 PD IEC/TS 62720 is provided1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester,