Si Wafer (100) 4 deg. off toward (110), 3"dia x 0.5 mm, 1 sp, N type, P doped,R:10-30 ohm.cm - SIPa76D05C1deg4R10 La(x)Sr(1-x)MnO3 STC-PC25 is a split-able test

STC-PC25 is a split-able test for a single-layer pouch of 1"x1" that is designed for high-throughput R&D battery material testings without any crimper

Major structural material: Cr Plated Steel

Biaxially Oriented Nylon (ONy)

In addition to the elements listed

Si Wafer (100) 4 deg. off toward (110), 3"dia x 0.5 mm, 1 sp, N type, P doped,R:10-30 ohm.cm - SIPa76D05C1deg4R10 La(x)Sr(1-x)MnO3 STC-PC25 is a split-able testSingle crystal Si Conductivity: N type ( P doped) Resistivity: 10 30ohm CM Size: 3" diameter x 0. 5 mm Orientation: (100) 4 Deg. Off Toward (110) Polish: One side polished Surface roughness: < 5A Optional: you may need tool below to handle the wafer ( click picture to order ) Other Crystal wafer A Z Plasma Cleaner Wafer Containers Dicing saw Film Coater