FEI Company 4022.192.91281 Interface Relay PCB Card MRSF 1 XL 830 FIB-SEM Used This ASM Advanced Semiconductor Materials

This ASM Advanced Semiconductor Materials 16-187152B01 Quartz Pin Lot of 13 is new surplus

This Nikon OPTISTATION 3 Binocular Eyepiece Microscope Assembly CFWN 10x/20 is used working surplus

Part No: 4S013-974

13-20-01601

FEI Company 4022.192.91281 Interface Relay PCB Card MRSF 1 XL 830 FIB-SEM Used This ASM Advanced Semiconductor MaterialsFEI Company 4022. 192. 91281 Interface Relay PCB Card MRSF 1 XL 830 FIB SEM Used Inventory # A 13994 Part No: 4022. 192. 91281 Model No: MRSF 1 4022. 192. 8128 Removed from a FEI Company XL 830 DualBeam FIB SEM Focused Ion Beam Scanning Electron Microscope System This FEI Company 4022. 192. 91281 Interface Relay PCB Card is used working surplus. Removed from a FEI Company XL 830 DualBeam FIB SEM Focused Ion Beam Scanning Electron Microscope System.