MS00300 - SEMI MS3 - Terminology for MEMS Technology Revision:SEMI MS3-0307 - Superseded statistical process control (SPC)

statistical process control (SPC)

SEMI E40-0702 (technical revision)

visible and IR interferometry

It is the responsibility of the users of this Standard to conform to the appropriate local codes and regulations as applied to this type of equipment

MS00300 - SEMI MS3 - Terminology for MEMS Technology Revision:SEMI MS3-0307 - Superseded statistical process control (SPC)This Standard was technically approved by the MEMS NEMS Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on May 19, 2015. Available at www. semiviews. org and www. semi. org in September 2015; originally published as SEMI PR11 1105; previously published March 2007. Microelectromechanical Systems (MEMS) technology, while related in many ways to integrated circuit and device technology,